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2830 S. Fairview St. Santa Ana, CA 92704 PH: (714) 979-8220 FAX: (714) 966-5256 MSAHX75L60C 600 Volts 75 Amps 1.8 Volts vce(sat) N-CHANNEL INSULATED GATE BIPOLAR TRANSISTOR Features * * * * * * * Rugged polysilicon gate cell structure high current handling capability, latch-proof Hermetically sealed, surface mount power package Low package inductance Very low thermal resistance Reverse polarity available upon request: MSAHX75L60D low VCE(sat) IGBT, low conduction losses Maximum Ratings @ 25C (unless otherwise specified) DESCRIPTION Collector-to-Emitter Breakdown Voltage (Gate Shorted to Emitter) @ TJ 25C SYMBOL BVCES BVCGR VGES VGEM IC25 IC90 ICM Imax PD Tj Tstg JC MAX. 600 600 +/-20 +/-30 75 60 200 100 300 -55 to +150 -55 to +150 0.25 UNIT Volts Volts Volts Volts Amps Amps Amps Watts C C C/W Collector-to-Gate Breakdown Voltage @ TJ 25C, RGS= 1 M Continuous Gate-to-Emitter Voltage Transient Gate-to-Emitter Voltage Continuous Collector Current Tj= 25C Tj= 90C Peak Collector Current, pulse width limited by Tjmax, Safe Operating Area (RBSOA) @ VGE= 15V, L= 30H (clamped inductive load), R G= 2.7, Tj= 125C, VCE= 0.8 x V CES Power Dissipation Junction Temperature Range Storage Temperature Range Thermal Resistance, Junction to Case Mechanical Outline COLLECTOR EMITTER GATE Datasheet# MSC0296A MSAHX75L60C Electrical Parameters @ 25C (unless otherwise specified) DESCRIPTION Collector-to-Emitter Breakdown Voltage (Gate Shorted to Emitter) Gate Threshold Voltage Gate-to-Emitter Leakage Current Collector-to-Emitter Leakage Current (Zero Gate Voltage Collector Current) Collector-to-Emitter Saturation Voltage (1) Forward Transconductance (1) Input Capacitance Output Capacitance Reverse Transfer Capacitance INDUCTIVE LOAD, Tj= 25C Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Off Energy INDUCTIVE LOAD, Tj= 125C Turn-on Delay Time Rise Time On Energy Turn-off Delay Time Fall Time Off Energy Total Gate Charge Gate-to-Emitter Charge Gate-to-Collector (Miller) Charge Antiparallel diode forward voltage SYMBOL BVCES VGE(th) IGES ICES VCE(sat) gfs Cies Coes Cres td(on) tri td(off) tfi Eoff td(on) tri Eon td(off) tfi Eoff Qg Qge Qgc VF CONDITIONS VGS = 0 V, I C = 250 A VCE = VGE, IC = 250 A VGE = 20V DC, VCE = 0 VCE =0.8*BVCES VGE = 0 V VGE= 15V, I C= 60A I C= 60A VCE 10 V; I C = 60 A MIN 600 2.5 TYP. MAX 5.0 100 200 200 1000 1.8 UNIT V V nA A V S pF T J = 25C T J = 125C TJ = 25C T J = 125C T J = 25C T J = 125C 30 1.8 40 4000 340 100 50 210 600 500 16 50 240 3 1000 1000 26 200 35 80 1.55 1.75 2 1.5 35 120 140 500 750 7 9 VGE = 0 V, V CE = 25 V, f = 1 MHz VGE = 15 V, V CE = 480 V, IC = 60 A, R G = 2.7 , L= 100 H note 2, 3 800 700 ns ns ns ns mJ ns ns mJ ns ns mJ nC VGE = 15 V, V CE = 480 V, IC = 60 A, R G = 2.7 , L= 100 H note 2, 3 VGE = 15 V, V CE = 300V, I C = 50A IE= 30 A T J = 25 C IE= 60 A T J = 25 C IE= 100 A T J = 25 C IE= 60 A T J = 150 C IE= 1 A, dIE/dt= 100 A/us, T J= 25C IE= 10 A, dIE/dt= 200 A/us, T J= 100C IE= 40 A, dIE/dt= 200 A/us, T J= 100C IE= 10 A, dIE/dt= 200 A/us, T J= 100C IE= 40 A, dIE/dt= 100 A/us, T J= 100C IE= 10 A, dIE/dt= 200 A/us, T J= 100C IE= 40 A, dIE/dt= 200 A/us, T J= 100C 250 50 100 Antiparallel diode reverse recovery time trr 150 Antiparallel diode reverse recovery charge Antiparallel diode peak recovery current Qrr IRM V V V V ns ns ns nC nC A A Notes (1) (2) (3) (4) Pulse test, t 300 s, duty cycle 2% switching times and losses may increase for larger V CE and/or R G values or higher junction temperatures. switching losses include "tail" losses Microsemi Corp. does not manufacture the igbt die; contact company for details. |
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